Citation: | LIU Chao, GUAN Yibin, ZHANG Aibing, SUN Yueqiang, LIANG Jinbao, ZHENG Xiangzhi, DING Jianjing, KONG Linggao, TIAN Zheng, WANG Wenjing. Study on Technology of Using Semiconductor Diode Volt-Ampere Characteristic to Test Langmuir Probe Performance[J]. Chinese Journal of Space Science, 2015, 35(6): 763-768. doi: 10.11728/cjss2015.06.763 |
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