Zhang Zhenli, Zhang Zhenlong, Han Jianwei, An Guangpeng, Cai Minghui, Feng Guoqiang, Ma Yingqi. Simulation study on single event upset induced by near space atmospheric neutron in electronic devices[J]. Chinese Journal of Space Science, 2011, 31(3): 350-354. doi: 10.11728/cjss2011.03.350
Citation:
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Zhang Zhenli, Zhang Zhenlong, Han Jianwei, An Guangpeng, Cai Minghui, Feng Guoqiang, Ma Yingqi. Simulation study on single event upset induced by near space atmospheric neutron in electronic devices[J]. Chinese Journal of Space Science, 2011, 31(3): 350-354. doi: 10.11728/cjss2011.03.350
|
Zhang Zhenli, Zhang Zhenlong, Han Jianwei, An Guangpeng, Cai Minghui, Feng Guoqiang, Ma Yingqi. Simulation study on single event upset induced by near space atmospheric neutron in electronic devices[J]. Chinese Journal of Space Science, 2011, 31(3): 350-354. doi: 10.11728/cjss2011.03.350
Citation:
|
Zhang Zhenli, Zhang Zhenlong, Han Jianwei, An Guangpeng, Cai Minghui, Feng Guoqiang, Ma Yingqi. Simulation study on single event upset induced by near space atmospheric neutron in electronic devices[J]. Chinese Journal of Space Science, 2011, 31(3): 350-354. doi: 10.11728/cjss2011.03.350
|
Simulation study on single event upset induced by near space atmospheric neutron in electronic devices
- 1.
Center for Space Science and Applied Research, Chinese Academy of Sciences, Beijing 100190
- 2.
Graduate University of Chinese Academy of Sciences, Beijing 100049
More Information
- Corresponding author:
Zhang Zhenli
- Received Date: 1900-01-01
- Rev Recd Date:
1900-01-01
- Publish Date:
2011-05-15