An OI-based Assimilation Method of Vertical Ionospheric Electron Density Profile Over Xiamen
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摘要: 最优插值(Optimal Interpolation, OI)同化是一种利用最小二乘法使分析误差方差极小化的方法. 提出并建立了一种电离层一维剖面最优插值的同化方法. 借鉴及参考气象的同化方法, 基于最优插值方法, 采用厦门电离层垂测仪2009年6至8月观测数据和一维电离层理论模式(IGGCAS1D)背景值来构建误差协方差, 并进行同化试验和分析预报. 结果表明方法可靠, 没有出现同化时背景数据与观测数据偏离较大的问题, 同化后所得结果与观测数据符合较好.Abstract: By comparing the development of data assimilation in meteorology, Optimal Interpolation (OI) assimilation in one-dimension ionosphere is introduced. OI assimilation is a method that minimizes error variance of analysis by non-linear least-squares. Based on IGGCAS1D (Institute of Geology and Geophysics, Chinese Academy of Sciences 1 Dimension) model and Xiamen digital ionosonde observations, OI assimilation has been validated by simulation experiments. The detailed information of observations is that, 11:00UT 15 June, 11:00UT 22 July, 11:15UT 31 August, 2009, respectively. The results show that analysis conforms to observation even if the model background is far away from it and that OI assimilation is validated. After that, using one of the results from simulation experiments (11:15UT, 31 August 2009), a residual prediction is introduced. The result of residual prediction accords with observation very well. From the difference between prediction and observation, it can be concluded that the residual prediction is a worthy method to be verified in future.
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