Numerical Calculation and Research of the Effects of Secondary Emission Characteristics on Surface Charging
-
摘要: 表面充电是最早被人们发现的空间环境效应, 是由空间环境引起的航天器异常和故障的主要诱因之一. 采用较精确的金属二次电子发射公式和局部电流平衡模型, 在无光照的情况下, 对不同表面材料及不同几何形体的航天器表面充电电位进行计算, 并绘制了表面材料的充电电位与最大二次电子发射系数之间的关系曲线. 根据数值计算结果及次级电子发射系数和曲线图得知, 航天器阴面充电电位与表面材料的原子序数、最大二次电子发射系数和入射离子引起的次级发射系数均有关. 该计算对航天器表面材料的选取和设计工艺有一定的参考价值.Abstract: Surface charging is a space environment effect. It is one of the major incentives for spacecraft anomalies and failures, which is caused by the space environment. By using more accurate universal formulas for the secondary electron yield from metals and the local current balance model, the charging potentials of shaded-surfaces of a spacecraft are calculated for different surface materials and shapes in MATLAB. According to the results, we draw several curves of the charging potentials and the maximum secondary electron yield. Based on the numerical results, the secondary electron yield and the curves, it can be concluded that spacecraft surface charging have a great relationship with the maximum secondary electron yield, atomic number and the secondary electron yield caused by incident ions. These give certain reference value for the selection and design technique of surface materials.
-
[1] Jiao Weixin. Science of Space Weather[M]. Beijing: China Meteorological Press, 2003. In Chinese (焦维新. 空间天气学[M]. 北京: 气象出版社, 2003) [2] Knott K. The equilibrium potential of a magnetospheric satellite in an eclipse situation[J]. Chin. J. Space Sci., 1972, 20:1137-1146 [3] Xie Aigen, Zhang Jian, Wang Tiebang. Secondary electron yield of 2~10keV electrons from metals[J]. High Power Las. Part. Beams, 2012, 24(2):481-485. In Chinese (谢爱根, 张健, 王铁邦. 金属的二次电子发射系数的表达式[J]. 强激光与粒子束, 2012, 24(2):481-485) [4] Xie Aigen, Yao Yijun, Su Jing, Zhang Jian. A universal formula for secondary electron yield form metals[J]. Nucl. Instrum. Meth. Phys. Res. B, 2010, 268(17/18):2565-2570 [5] Prokopenko S M L, Laframboise J G. Prediction of large negative shaded-side spacecraft potentials [C]// Space Charging Technology Conference. Lewis: Lewis Research Center, 1977. 369-387 [6] Wang Boyi, Wu Qingsong, Jiang Rongfu, Xu Yanhou. Calculation of the upper bound of negative potentials of spacecrafts in a Geostationary orbit by using the local current balance model[J]. Chin. J. Space Sci., 1991, 11(2):133-141. In Chinese (王柏懿, 吴清松, 江荣富, 徐燕候. 采用局部电流平衡模型计算同步轨道航天飞行器上界负电位[J]. 空间科学学报, 1991, 11(2):133-141) [7] Reimer L, Tolkamp C. Measuring the backscattering coefficient and secondary electron yield inside a scanning electron microscope[J]. Scanning, 1980, 3(1):35-39 [8] Shimizu R. Secondary electron yield with primary electron beam of kilo-electron-volts[J]. J. Appl. Phys., 1974, 45(5):2107-2111 [9] Suszcynsky D M, Borovsky J, Goertz C K. Secondary electron yields of solar system ices[J]. J. Geophys. Res., 1992, 97(E2):2611-2619 [10] Sternglass E J. Backscattering of kilovolt electrons from solids[J]. Phys. Rev., 1954, 95:345-358 [11] Kanaya K, Kawakatsu H. Secondary electron emission due to primary and backscattered electrons[J]. J. Phys. D, 1972, 5:1727-1741 [12] Xie Aigen, Lei Yong, Yao Yijun. The relations among energy exponent, incident energy and real efficient secondary electron emission coefficient at higher incident electron energy[J]. J. Anhui Univ. Nat. Sci. Ed., 2009, 33(5):53-56. In Chinese (谢爱根, 雷勇, 姚义俊. 较高能有效真二 次电子发射系数与入射能量、能量幂次的关系[J]. 安徽大学学报, 2009, 33(5):53-56) [13] Baragiola R A, Alonso E V, Oliva Florio A. Electron emission from clean metal surfaces induced by low-energy light ions[J]. Phys. Rev. B, 1979, 19(1):121-129 [14] Whipple E C. Potentials on surfaces in space[J]. Rep. Prog. Phys., 1981, 44:1197-1250 [15] Chung M S, Everhart T E. Simple calculation of energy distribution of low-energy secondary electrons emitted from metals under electron bombardment[J]. J. Appl. Phys., 1974, 45:707-709 [16] Bronstein I M, Fraiman B S. Vtorichnaya Elektronnaya Emissiya (Secondary electron emission). Moskva: Nauka, 1969. 220, 340 [17] Bruining H, de Boer J H. Secondary electron emission Part I. Secondary electron emission of metals[J]. Phys. A, 1938, 5(1):17-30 [18] Mai Shengli, Wang Li, Li Kai, Qin Xiaogang. Numerical simulation of the effects of secondary electron emission characteristic on material surface charging[J]. Vac. Cryog., 2006, 12(2):87-90. In Chinese (买胜利, 王立, 李凯, 秦晓刚. 材料二次电子发射特性对表面充电过程影响的数值模拟研究[J]. 真空与低温, 2006, 12(2):87-90) [19] Bongeler R, Golla U, Kussens M, et al. Electron-specimen interactions in low-voltage scanning electron microscopy[J]. Scanning, 1993, 15(1):30-42 [20] Song Yougao. The space environment of the satellite surface charging and its simulation method[J]. J. Astron., 1988, 1:89-94. In Chinese (宋佑诰. 卫星表面充电空间环境及其模拟方 法[J]. 宇航学报. 1988, 1:89-94)
点击查看大图
计量
- 文章访问数: 2615
- HTML全文浏览量: 116
- PDF下载量: 969
- 被引次数: 0