Volume 37 Issue 2
Mar.  2017
Turn off MathJax
Article Contents
CHENG Jia, MA Yingqi, HAN Jianwei, ZHU Xiang, SHANGGUAN Shipeng, CHEN Rui. Experimental Assessment and Mitigation of Operational Amplifier's SET Effect[J]. Chinese Journal of Space Science, 2017, 37(2): 222-228. doi: 10.11728/cjss2017.02.222
Citation: CHENG Jia, MA Yingqi, HAN Jianwei, ZHU Xiang, SHANGGUAN Shipeng, CHEN Rui. Experimental Assessment and Mitigation of Operational Amplifier's SET Effect[J]. Chinese Journal of Space Science, 2017, 37(2): 222-228. doi: 10.11728/cjss2017.02.222

Experimental Assessment and Mitigation of Operational Amplifier's SET Effect

doi: 10.11728/cjss2017.02.222
  • Received Date: 2016-02-25
  • Rev Recd Date: 2017-01-02
  • Publish Date: 2017-03-15
  • Single Event Transients (SET) of linear device have the characteristics of transience and propagation, which cause great difficulties to fault location and mitigation design for on-orbit electronic systems and devices, and are significant threat to the reliability of spacecraft. To mitigate SET for linear devices, comprehensive experimental assessment on the SET is required, and parameters of the SET in the worst case especially need to be determined. Then specific filtering circuit can be designed according to the worst case parameters of SET and the application circuits. In this paper, SET assessment and mitigation on operational amplifier LM124 which is typically used in spacecraft are investigated. Firstly, SET characteristics of the device are evaluated by pulse laser facility, and the worst SET with duration of 35μs and amplitude of 7.2V are observed. Then, by using Hspice simulation, the SET of LM124 are compared and verified with experimental assessment, and mitigation on the worst SET using different parameters of filter circuits are investigated. Finally, the mitigation on worst SET with the optimized filtering circuit is investigated and verified again using the pulsed laser facility. The work of this paper is useful to investigate and mitigate SET of other linear devices applied in space.

     

  • loading
  • [1]
    POIVEY C, BUCHNER S, HOWARD J, et al. Testing Guidelines for Single Event Transient (SET) Testing of Linear Devices[R]. Washington D C:NASA Goddard Space Flight Center, 2003
    [2]
    FENG Guoqiang, HU Yonggui, WANG Jianan, et al. Experimental study on the effect of operational amplifier[J]. Chin. J. Space Sci., 2010, 30(2):170-175(封国强, 胡永贵, 王健安, 等. 运算放大器SET效应的试验研究[J]. 空间科学学报, 2010, 30(2):170-175)
    [3]
    ECOFFET R, DUZELLIER S, TASTET P, et al. Observation of heavy ion induced transients in linear cir-cuits[C]//Radiation Effects Data Workshop. DOI: 10.1109/REDW.1994.633038
    [4]
    STERNBERG A L, MASSENGILL L W, SCHRIMPF R D, et al. Effect of amplifier parameters on single-event transients in an inverting operational ampli-fier[C]//European Conference on Radiation and Its Effects on Components and Systems, 2001:398-404
    [5]
    POIVEY C. NEPPERC Application Notes for Analog Linear Devices[R]. Washington D C:NASA Goddard Space Flight Center, 2004:1-51
    [6]
    KOGA R, CRAIN S H, CRAWFORD K B, et al. Single event transient (SET) sensitivity of radiation hardened and COTS voltage comparators[C]//Radiation Effects Data Workshop, 2000. IEEE, 2000:53-60
    [7]
    LI Yongzheng, WEI Party, LV Desheng. Space science with COTS components quality and reliability assurance[J]. Electr. Products Reliab. Environ. Test., 2014, 32(5):37-42(李永正, 党炜, 吕德胜, 等. 空间科学用COTS元器件的质量与可靠性保证研究[J]. 电子产品可靠性与环境试验, 2014, 32(5):37-42)
    [8]
    POIVEY C, LABEL K, FORNEY J, et al. Single event transients in LM124 operational amplifier heavy ion test report[R]//Single Event Transients in LM124 Operational Amplifier Heavy Ion Test Report, 2003:1-38
    [9]
    LABEL K, POIVEY C, HOWARD J W, et al. Single Event Transients in LM124 Operational Amplifier Laser Test Report[R]//Single Event Transients in LM124 operational amplifier Laser Test Report, 2001:1-59
    [10]
    ADELL P, SCHRIMPF R D, BARNABY H J, et al. Ana-lysis of single-event transients in analog circuits[J]. IEEE Trans. Nucl. Sci., 2000, 47(6):2616-2623
    [11]
    MA Yingqi, FENG Guoqiang, AN Guangpeng, et al. Experimental study on single event transients of 4N49 optocoupler[J]. Atom. Energy Sci. Tech., 2010, 6(44):764-768(马英起, 封国强, 安广朋, 等. 光电耦合器4N49单粒子瞬态脉冲效应的试验研究[J]. 原子能科学与技术, 2010, 6(44):764-768)
    [12]
    ADELL P, SCHRIMPF R D, BARNABY H J, et al. Ana-lysis of single-event transients in analog circuits[J]. IEEE Trans. Nucl. Sci., 2000, 47(6):2616-2623
    [13]
    HUANG Jianguo, HAN Jianwei. Pulsed laser simulation of single particle effect of equivalent LET calculation[J]. Chin. Sci.:G, 2004, 34(6):601-609(黄建国, 韩建伟. 脉冲激光模拟单粒子效应的等效LET计算[J]. 中国科学:G辑, 2004, 34(6):601-609)
  • 加载中

Catalog

    通讯作者: 陈斌, bchen63@163.com
    • 1. 

      沈阳化工大学材料科学与工程学院 沈阳 110142

    1. 本站搜索
    2. 百度学术搜索
    3. 万方数据库搜索
    4. CNKI搜索

    Article Metrics

    Article Views(1133) PDF Downloads(980) Cited by()
    Proportional views
    Related

    /

    DownLoad:  Full-Size Img  PowerPoint
    Return
    Return