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• 论文 •

Experimental Research on SET Effects of Operational Amplifier

Feng Guoqiang;Hu Yonggui;Wang Jianan; Huang Jianguo;Ma Yingqi; Han Jianwei;Zhang Zhenlong

• Received:1900-01-01 Revised:1900-01-01 Online:2010-03-15 Published:2010-03-15

Abstract: In recent years, the Single Event Transient (SET) has gradually come into focus in the field of Single Event Effect (SEE) research. The SET effects of operational amplifier SF3503, which is designed in the applications of inverting amplifier and voltage comparator, have been investigated by pulsed laser test facility. The equivalent Linear Energy Transfer (LET) has been calculated with the pulsed laser and device parameters, including pulsed laser wavelength, energy and dielectric depth in device. The identification of sensitive nodes, LET threshold and SET pulse shape characteristics has been tested. While all the sensitive nodes are included in the input stage and amplified stage, LET threshold is no more than 1.2 MeV&#8226;cm2&#8226;mg-1, the amplitude of 27 V and duration of 51μs have been achieved in the voltage comparator. Positive, negative and dual polar pulses were observed in the experiment. The transistor Q16 of amplified stage has been examined as the most susceptible node in the circuit. For the vulnerable SET effects of the SF3503, the device is not qualified for application in the space mission directly.