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• 空间探测技术 • Previous Articles     Next Articles

Study on Assessment Method of Reliability of Spaceflight Electronic Device

SUN Peng1, ZHAO Yang1, DONG Haiping2   

  1. 1. Beijing Spaceflight Autocontrol Research Institute, Beijing 100854;
    2. School of Mechatronical Engineering, Beijing Institute of Technology, Beijing 100081
  • Received:2011-01-06 Revised:2011-10-28 Online:2012-03-15 Published:2012-03-15

Abstract: A Bayesian reliability assessment method for spaceflight electronic device is put forward. The method combines the reliability information of the whole system and its subsystems. At first, the maximum entropy method is used to syncretize reliability information of subsystems; then the calculation formulas of moments of system reliability are deduced from reliability moments of subsystems and inheritance factor is determined and mixed Beta distribution is built; finally, the posterior distribution is used to assess system reliability. With the new method, the reliability of a spaceflight electronic device is evaluated to reach 0.9991 under the confidence level 0.70 with 240 whole system tests which is one-fifth of system tests needed by the classical method. It is feasible to use the new method to assess reliability of spaceflight electronic device.

CLC Number: