A Method of Profile Simulation Reduction for Ionogram
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摘要: 本文提出一种频高图的剖面模拟换算法,利用寻常分量描迹确定多层结构电离层剖面的分析表达式.此方法程序简单,不必度量太多数据;适用于电离层台站网的日常剖面分析.Abstract: A method of profile simulation reduction for ionogram using one single-component trace is proposed. It can be used to determine the profiles of the ionosphere with multi-layer structures. The program of the mothod is simple and measured values required for reduction is less. It is convenient for routine profile analysis of the network of ionosphere stations.
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