Volume 36 Issue 3
May  2016
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Article Navigation >  Chinese Journal of Space Science  > 2016  >  36(3): 395-400
REN Yiwen, GUO Jianhua, WANG Shen. Design and Realization of Charge Measurement System Based on VA32TA5[J]. Chinese Journal of Space Science, 2016, 36(3): 395-400. doi: 10.11728/cjss2016.03.395
Citation: REN Yiwen, GUO Jianhua, WANG Shen. Design and Realization of Charge Measurement System Based on VA32TA5[J]. Chinese Journal of Space Science, 2016, 36(3): 395-400. doi: 10.11728/cjss2016.03.395
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Design and Realization of Charge Measurement System Based on VA32TA5

doi: 10.11728/cjss2016.03.395 cstr: 32142.14.cjss2016.03.395
  • 1.

    University of Chinese Academy of Sciences, Beijing 100049

  • 2.

    Purple Mountain Observatory, Chinese Academy of Sciences, Nanjing 210008

  • 3.

    Key Laboratory of Dark Matter and Space Astronomy, Chinese Academy of Sciences, Nanjing 210008

  • Received Date: 2015-04-23
  • Rev Recd Date: 2015-07-01
  • Publish Date: 2016-05-15
    Abstract
  • Semiconductor detector has lots of advantages,such as good resolution,high sensitivity and wide linear range,which make it the most widely used detector in space exploration of X/γ Ray.Semiconductor detection system has strict requirements on its electronics system's noise level and measurement accuracy.Aiming at these requirements,a new charge measurement system based on the multi-channel charge measurement chip VA32TA5 is designed.This paper gives a detailed introduction of the system's design principle and implementation procedure,and also gives the preliminary results of performance at the end.Testing results indicate that the system has low noise and good linearity and therefore can be applied to semiconductor detectors,e.g.silicon strip detector,CdZnTe detector.

     

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