Volume 44 Issue 6
Dec.  2024
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Article Navigation >  Chinese Journal of Space Science  > 2024  >  44(6): 1147-1154 Open Access
XUE Guofeng, ZHOU Changyi, AN Junshe, WU Hao, WANG Tianwen. SEE Upset Characteristics of BRAM in 28 nm Bulk FPGA by Pulsed Laser Test (in Chinese). Chinese Journal of Space Science, 2024, 44(6): 1147-1154 doi: 10.11728/cjss2024.06.2024-0007
Citation: XUE Guofeng, ZHOU Changyi, AN Junshe, WU Hao, WANG Tianwen. SEE Upset Characteristics of BRAM in 28 nm Bulk FPGA by Pulsed Laser Test (in Chinese). Chinese Journal of Space Science, 2024, 44(6): 1147-1154 doi: 10.11728/cjss2024.06.2024-0007
shu

SEE Upset Characteristics of BRAM in 28 nm Bulk FPGA by Pulsed Laser Test

doi: 10.11728/cjss2024.06.2024-0007 cstr: 32142.14.cjss.2024-0007
  • 1.

    National Space Science Center, Chinese Academy of Sciences, Beijing 100190

  • 2.

    University of Chinese Academy of Sciences, Beijing 100049

  • Received Date: 2024-01-09
  • Rev Recd Date: 2024-03-01
    • Available Online: 2024-03-16
    Abstract
  • In order to get a well-targeted Single Event Upset (SEU) mitigation for block RAM in SRAM based FPGA, a method is proposed for researching the Single Event Effect (SEE) characteristics of FPGA and get the Multiple-Cell Upset (MCU) pattern which reveal the upset mode of adjacent cells in BRAM. Pulsed laser tests were performed on 28 nm bulk Kintex-7 XC7K410T-FFG900 FPGA after analyzing the structure of configurable frame in Kintex-7 serial FPGA. The Single-Cell Upset and Multiple-Cell Upset induced by pulsed laser were observed during the test, and the cross section under different laser energy was tested. Besides, the Multiple-Cell Upset patterns of BRAM in FPGA were analyzed. The result shows that the proportion of Multi-Cell Upset climbs up with the increasing laser energy, while the proportion of Single-Cell Upset goes in the opposite way. Two to eleven bits Multiple-Cell Upset may be induced by one pulsed laser without Multiple-Bit Upset in any logical word or byte according to the error injecting test result. Some SEE mitigation methods were suggested according to the results of SEE tests to improve the reliability of SRAM based FPGA in space application.

     

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